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In this paper we correlate the Atomic Force Microscope probe movement with surface location while scanning in the imaging and Force versus Distance modes. Static and dynamic stick-slip processes are described on a scale of nanometres to microns on a range of samples.
We demonstrate the limits and range of the tip apex being fixed laterally in the force versus distance mode and static friction slope dependence on probe parameters. Micron scale static and dynamic friction can be used to puposefully manipulate soft surfaces to produce well defined frictionhal gradients. |