Doping dependence of the electronic structure in La(2-x)SrxCuO4 as determined by angle resolved photoelectron spectroscopy
Månsson, Martin1; Claesson, Thomas1; Pailhés, Stéphane2; Chang, Johan2; Mesot, Joël2; Shi, Ming2; Patthey, Luc2; Momono, Naoki3; Oda, Migaku3; Ido, Masayuki3; Voigt, Jörg4; Lipscombe, Oliver5; Hayden, Stephen M.5; Tjernberg, Oscar1
1Sweden;
2Switzerland;
3Japan;
4Germany;
5United Kingdom

Angle resolved photoelectron spectroscopy has been used to follow the near Fermi-edge dispersion in La(2-x)SrxCuO4 as a function of doping (x = 0.1 → x = 0.22). Data, from high quality in situ cleaved single crystals, was collected at the SIS beam line of the Swiss Light Source (SLS). The data show a clear quasi-particle peak discernible along the entire Fermi surface even for the strongly underdoped sample (x=0.10). From the data we are also able to extract the Fermi surface evolution as a function of doping as well as the doping and binding energy dependence of the quasi-particle scattering rate.
Acknowledgments: This research has been supported by the Swedish Research Council, the Göran Gustafsson Foundation, the Swiss National Science Foundation (through NCCR, MaNEP, and grant Nr 200020-105151), and the European Union.
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