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Principal components regression (PCR) was used to calibrate time-of-flight secondary ion mass spectrometry (TOF-SIMS) positive data against X-ray photoelectron spectroscopy (XPS) data and to predict the atomic concentration of the (C-O) functional group on the surface of plasma treated polypropylene films. A multi-component model was constructed and was effective in predicting a surface function group (C-O) with accurate predictions achieved using the leave-one-out prediction method. TOFSIMS with PCR modelling is demonstrated to provide an alternative method of evaluating the relative atomic concentrations of surface functional groups for plasma treated polypropylene films without the need for other quantitative or semi-quantitative techniques such as XPS.
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