Nanospectroscopy of single silicon nanowire surface using energy filtered X-ray photoElectron emission microscopy | |||
Bailly, Aude; Barrett, Nick; Renault, Olivier; Zagonel, Luiz Fernando; Gentile, Pascal; Pauc, Nicolas; Baron, Thierry; Dhalluin, Florian; Cezar, Julio Criginski; Brookes, Nicholas France |