Depth-profiling of layered structure in thick anodic aluminum-alloy oxide films observed mainly by Fourier transform infrared microspectroscopy | |||
Tsukahara, Sonoko; Takahashi, Yoshikazu; Sato, Hiroshi; Tsujita, Takeshi; Nakamura, Hiroyuki; Ishikawa, Yuuichi; Misawa, Shunji; Inayoshi, Sakae S.; Ishigure, Fumiaki Japan |