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Future nanoscale devices, and molecular systems in particular, are subjected to a principal difficulty: the inability of existing electrical tools to selectively access inner regions. A promising answer to this problem is proposed by means of chemically resolved electrical measurements (CREM), a non-contact method based on x-ray photoelectron spectroscopy (XPS). CREM can provide I-V plots at selected sub-surface regions, extracting rich electrical information from hetero-structured systems. CREM applications and the achievement of nearly atomic (electrical) resolution within organic molecular layers will be shown. |