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Edu-Scope is a scanning probe microscope (SPM) from nQuip AB (Sweden) that is developed for nano-technology education. The instrument started-off as a Swedish governmental granted research project at the Solid state physics department at Lund University in Sweden. The specific goal were to develop an atomic force microscope (AFM) for science studies at the pre-university level - clearly demonstrating both the operational (such as imaging and force-spectroscopy techniques) and technological (scanner, cantilever and optical signal path, etc) characteristics of the AFM. The Edu-Scope AFM incorporates CCD-camera imaging of tip-sample region, automated motorized tip-sample approach, full PID-controller, contact mode imaging and force spectroscopy. It is accompanied with literature such as "Laborative manual for teachers" and "Introduction to SPM techniques". Optional accessories available inludes STM module, liquid-imaging AFM cantilever holder, varying scanner ranges. The Edu-Scope AFM is being used at both pre-university (Swedish 'gymnasium') and university level. In this presentation comments on its usage at the Lund university nano-technology education will be given. |